Invention Grant
US07768742B2 Method and apparatus for providing a truncated profile probe for perpendicular recording
有权
用于提供用于垂直记录的截头轮廓探头的方法和装置
- Patent Title: Method and apparatus for providing a truncated profile probe for perpendicular recording
- Patent Title (中): 用于提供用于垂直记录的截头轮廓探头的方法和装置
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Application No.: US10430949Application Date: 2003-05-07
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Publication No.: US07768742B2Publication Date: 2010-08-03
- Inventor: Binyam A. Giorgis , Hugo A. E. Santini
- Applicant: Binyam A. Giorgis , Hugo A. E. Santini
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agency: Merchant & Gould
- Main IPC: G11B5/187
- IPC: G11B5/187 ; G11B5/31

Abstract:
The present invention is a truncated probe for a perpendicular recording write head. The truncated probe is formed in a resist using a pullback process. In the pullback process, a trench is formed in the resist. The resist is then heated to a required temperature for a predetermined duration of time. By controlling the temperature and time, the amount of pullback of the resist is controlled to form a specified angle for the truncated probe. Further, the present invention increases the efficiency of the write head by reducing the distance between the air-bearing surface (ABS) and a magnetic back gap of the perpendicular recording write head yokes. This reduction reduces the length of the write head and permits a faster rise time of a recorded signal.
Public/Granted literature
- US20040223258A1 Method and apparatus for providing a truncated profile probe for perpendicular recording Public/Granted day:2004-11-11
Information query
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