Invention Grant
- Patent Title: Proximity probe transmitter
- Patent Title (中): 接近探头发射器
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Application No.: US11516439Application Date: 2006-09-06
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Publication No.: US07768258B2Publication Date: 2010-08-03
- Inventor: David Dobsky
- Applicant: David Dobsky
- Applicant Address: US TX Houston
- Assignee: Metrix Instrument Co., L.P.
- Current Assignee: Metrix Instrument Co., L.P.
- Current Assignee Address: US TX Houston
- Agency: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.
- Main IPC: G01R33/12
- IPC: G01R33/12

Abstract:
A digital based two wire proximity transmitter system and a method for calibrating the system, wherein the transmitter includes a customized linearization table uniquely generated during calibration to take into account the unique impedance properties of a particular probe/coaxial cable configuration. During calibration, the probe is positioned adjacent a calibration target. The calibration target is selected to have the same material characteristics as the target to be monitored during actual operation of the transmitter in the field. At a fixed distance between the probe and calibration target, the resonant frequency of the probe/cable system is determined. Thereafter, utilizing this resonant frequency to excite the probe, the voltage response of the probe/cable system is determined as the distance between the probe and the target material is incrementally changed. The voltage output is used to build a table for incremental distances, wherein each distance is characterized by a non-linear output that has been equated to a linear output. This uniquely generated table is subsequently downloaded into the transmitter for reference during monitoring.
Public/Granted literature
- US20080054891A1 Proximity probe transmitter Public/Granted day:2008-03-06
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