Invention Grant
- Patent Title: Method of correcting coordinates, and defect review apparatus
- Patent Title (中): 校正坐标的方法和缺陷检查装置
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Application No.: US11753966Application Date: 2007-05-25
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Publication No.: US07752001B2Publication Date: 2010-07-06
- Inventor: Takehiro Hirai , Kazuo Aoki , Kumi Kaneko
- Applicant: Takehiro Hirai , Kazuo Aoki , Kumi Kaneko
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2006-146042 20060526
- Main IPC: G01C17/38
- IPC: G01C17/38 ; G21C17/00

Abstract:
The present invention provides a method of correcting coordinates so as to quickly and properly arrange a sample in a field of view in a review apparatus for moving a sample stage onto the specified coordinates to review the sample. A review apparatus according to the present invention, which is a review apparatus for moving a sample stage onto coordinates previously calculated by a checking apparatus to review the sample, has a function of retaining a plurality of coordinate correction tables to correct a deviation between a coordinate value previously calculated by a checking apparatus and an actual sample position detected by the review apparatus. The review apparatus evaluates correction accuracy of the plurality of coordinate correction tables and applies one of the coordinate correction tables with the maximum evaluation value.
Public/Granted literature
- US20070276620A1 METHOD OF CORRECTING COORDINATES, AND DEFECT REVIEW APPARATUS Public/Granted day:2007-11-29
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