Invention Grant
- Patent Title: Process and system for detecting surface anomalies
- Patent Title (中): 检测表面异常的过程和系统
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Application No.: US11928399Application Date: 2007-10-30
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Publication No.: US07750643B2Publication Date: 2010-07-06
- Inventor: Curtis Wayne Rose
- Applicant: Curtis Wayne Rose
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R27/08
Abstract:
Processes and systems for detecting surface anomalies in components generally includes contacting a surface of the component with a detection apparatus, wherein the detection apparatus includes at least one post, a wire extending from the post and a sensor in operative communication the wire; and sensing the surface anomaly as an increase in resistance of the wire across the surface.
Public/Granted literature
- US20090108830A1 PROCESS AND SYSTEM FOR DETECTING SURFACE ANOMALIES Public/Granted day:2009-04-30
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