Invention Grant
- Patent Title: Method and apparatus for analog graphics sample clock frequency verification
- Patent Title (中): 模拟图形采样时钟频率验证方法和装置
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Application No.: US11355789Application Date: 2006-02-16
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Publication No.: US07733424B2Publication Date: 2010-06-08
- Inventor: John Michael Hayden , Bing Ouyang , Troy Lane Ethridge , Anuradha Sundararajan , Larry D. Dickinson
- Applicant: John Michael Hayden , Bing Ouyang , Troy Lane Ethridge , Anuradha Sundararajan , Larry D. Dickinson
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Charles A. Brill; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A measure of the difference between successive frames of the image is computed for a sequence of clock phases. The measure can be a count taken over pixels of the magnitude of the difference between a pixel in one frame and the corresponding pixel in a following frame exceeding a threshold value. The frequency of the clock is verified using a characteristic of the frame difference. The characteristic can be the ratio of the maximum measure to the minimum measure over the selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
Public/Granted literature
- US20060274207A1 Method and apparatus for analog graphics sample clock frequency verification Public/Granted day:2006-12-07
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