A method includes storing a first data to a first portion of a storage location of a storage component of a processing device in association with a first store operation and obtaining a second data from the storage location, the second data being stored at the storage location prior to the first data. The method further includes determining whether the storage location has a bit error at second portion of the storage location different from the first portion based on the second data obtained from the storage location. The method additionally includes storing a third data to a second portion of the storage location in response to determining the storage location has a bit error at the second portion, wherein the third data is to correct the bit error.