Invention Grant
- Patent Title: Metastability effects simulation for a circuit description
- Patent Title (中): 电路描述的均衡性效应模拟
-
Application No.: US12029440Application Date: 2008-02-11
-
Publication No.: US07712062B2Publication Date: 2010-05-04
- Inventor: Tai An Ly , Ka Kie Kwok , Vijaya Vardhan Gupta , Lawrence Curtis Widdoes, Jr.
- Applicant: Tai An Ly , Ka Kie Kwok , Vijaya Vardhan Gupta , Lawrence Curtis Widdoes, Jr.
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/45

Abstract:
A circuit design that contains at least two clock domains is simulated using a novel system and method for injecting the effects of metastability. The system includes detectors for detecting, during simulation, when a clock in a transmit clock domain and a clock in a receive clock domain are aligned and when the input of a register receiving a clock-domain-crossing signal is changing. The system includes coverage monitors for measuring, during simulation, statistics related to metastability injection. The system accurately models the effects of metastability by, at appropriate times during simulation, pseudo-randomly inverting outputs of registers receiving clock-domain-crossing signals. By accurately modeling the effects of metastability, errors in the circuit design can be detected while simulating a pre-existing simulation test. The simulation with metastability effects injection is repeatable and requires no modification of pre-existing RTL design files or simulation test files.
Public/Granted literature
- US20080134115A1 METASTABILITY EFFECTS SIMULATION FOR A CIRCUIT DESCRIPTION Public/Granted day:2008-06-05
Information query