Invention Grant
- Patent Title: Silicon wafer having through-wafer vias
- Patent Title (中): 具有贯通晶片通孔的硅晶片
-
Application No.: US12202638Application Date: 2008-09-02
-
Publication No.: US07709950B2Publication Date: 2010-05-04
- Inventor: Cormac MacNamara , Conor Brogan , Hiugh J. Griffin , Robin Wilson
- Applicant: Cormac MacNamara , Conor Brogan , Hiugh J. Griffin , Robin Wilson
- Applicant Address: GB Belfast
- Assignee: Icemos Technology Ltd.
- Current Assignee: Icemos Technology Ltd.
- Current Assignee Address: GB Belfast
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Main IPC: H01L23/12
- IPC: H01L23/12 ; H01L23/48

Abstract:
A method of manufacturing a semiconductor device includes providing a semiconductor substrate having first and second main surfaces opposite to each other. A trench is formed in the semiconductor substrate at the first main surface. The trench extends to a first depth position in the semiconductor substrate. The trench is lined with the dielectric material. The trench is filled with a conductive material. An electrical component is electrically connected to the conductive material exposed at the first main surface. A cap is mounted to the first main surface. The cap encloses the electrical component and the electrical connection.
Public/Granted literature
- US20080315368A1 Silicon Wafer Having Through-Wafer Vias Public/Granted day:2008-12-25
Information query
IPC分类: