Invention Grant
- Patent Title: Microscope with higher resolution and method for increasing same
- Patent Title (中): 显微镜具有更高的分辨率和增加方法
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Application No.: US11806459Application Date: 2007-05-31
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Publication No.: US07709809B2Publication Date: 2010-05-04
- Inventor: Michael Kempe
- Applicant: Michael Kempe
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microimaging GmbH
- Current Assignee: Carl Zeiss Microimaging GmbH
- Current Assignee Address: DE Jena
- Agency: Jacobson Holman PLLC
- Priority: DE102006026204 20060531
- Main IPC: F21V9/16
- IPC: F21V9/16

Abstract:
Microscope with higher resolution with partial spatial superposition in the illumination by an excitation beam and a de-excitation beam and/or a switching beam in a fluorescing sample, whereby the light from the sample is deflected, whereby, in the excitation beam and/or in the de-excitation and/or the switching beam, at least one combination of devices exercising circular and radial influence on the spatial phase is provided.
Public/Granted literature
- US20080007730A1 Microscope with higher resolution and method for increasing same Public/Granted day:2008-01-10
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