Invention Grant
- Patent Title: Image enhancement for multiple exposure beams
- Patent Title (中): 多个曝光光束的图像增强
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Application No.: US11877470Application Date: 2007-10-23
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Publication No.: US07709165B2Publication Date: 2010-05-04
- Inventor: Peter Ekberg
- Applicant: Peter Ekberg
- Applicant Address: SE Taby
- Assignee: Micronic Laser Systems AB
- Current Assignee: Micronic Laser Systems AB
- Current Assignee Address: SE Taby
- Agency: Haynes Beffel & Wolfeld LLP
- Agent Ernest J. Beffel, Jr.
- Main IPC: G03F9/00
- IPC: G03F9/00 ; G03C5/00

Abstract:
An aspect of the present invention includes a method for patterning a workpiece covered at least partly with a layer sensitive to electromagnetic radiation by using a plurality of exposure beams having a predetermined separation in at least a first direction for exposing a pattern onto said workpiece, where said predetermined separation is fixed to an initial system pitch in said first direction, comprising the actions of: scaling a pattern pitch in said first direction to be an integer multiple of said system pitch, adjusting the initial system pitch in said first direction to be an adjusted system pitch to maintain a scale of said pattern, adjusting said predetermined separation of exposure beams to said adjusted system pitch.
Public/Granted literature
- US20090170016A1 IMAGE ENHANCEMENT FOR MULTIPLE EXPOSURE BEAMS Public/Granted day:2009-07-02
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