Invention Grant
- Patent Title: Sample analyzer and error information displaying method
- Patent Title (中): 样品分析仪和错误信息显示方法
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Application No.: US12284146Application Date: 2008-09-18
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Publication No.: US07707010B2Publication Date: 2010-04-27
- Inventor: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-243428 20070920
- Main IPC: G06F17/40
- IPC: G06F17/40

Abstract:
The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner. The sample analyzer 1 comprises a sensor for detecting a status of a measurement unit 2 including an error status; a display section 400b; and a controller 400a for controlling the display section 400b so as to display recovery information for recovering the measurement unit 2 from the error status and an error-occurring place image regarding a place where an error has occurred, when the sensor detects the error status of the measurement unit 2.
Public/Granted literature
- US20090082984A1 Sample analyzer and error information displaying method Public/Granted day:2009-03-26
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