A SRAM memory cell including two inverters and a plurality of switches is provided. The SRAM cell is manufactured in a technology offering N/P shunt capabilities and the inputs of the inverters are connected to at least one pair of bit lines (BLa, BLa/; BLb, BLb/) via two of the switches. The switches are controlled by a signal word line (WLa, WLb). Each inverter includes a first transistor (MN0, MN1) of a first conductivity type and a second transistor (MP0, MP1) of a second conductivity type. Each switch includes at least a third transistor (MN2, MN3) of the first conductivity type, characterized in that the two transistors (MP0, MP1) of the second conductivity type in the inverters are arranged in two opposite end regions of the memory cell, respectively.