Invention Grant
- Patent Title: Duty cycle correction circuit
- Patent Title (中): 占空比校正电路
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Application No.: US11454426Application Date: 2006-06-14
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Publication No.: US07705647B2Publication Date: 2010-04-27
- Inventor: Liang Dai , Lam V. Nguyen
- Applicant: Liang Dai , Lam V. Nguyen
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Jiayu Xu
- Main IPC: H03K3/017
- IPC: H03K3/017

Abstract:
A duty cycle correction circuit capable of generating a clock signal having good (e.g., approximately 50%) duty cycle is described. The duty cycle correction circuit includes a clock deskew circuit and a duty cycle detection circuit. The clock deskew circuit receives an input clock signal that may have poor duty cycle, adjusts the input clock signal based on a control, and provides an output clock signal having an adjustable duty cycle. The duty cycle detection circuit detects error in the duty cycle of the output clock signal and generates the control in response to the detected error in the duty cycle. The clock deskew circuit and the duty cycle detection circuit implement a feedback loop that senses error in the duty cycle of the output clock signal and feeds back the control to correct the duty cycle error.
Public/Granted literature
- US20070290730A1 Duty cycle correction circuit Public/Granted day:2007-12-20
Information query
IPC分类: