Invention Grant
- Patent Title: Scanning ion probe systems and methods of use thereof
- Patent Title (中): 扫描离子探针系统及其使用方法
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Application No.: US12132730Application Date: 2008-06-04
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Publication No.: US07705299B2Publication Date: 2010-04-27
- Inventor: Andrei G. Fedorov
- Applicant: Andrei G. Fedorov
- Applicant Address: US GA Atlanta
- Assignee: Georgia Tech Research Corporation
- Current Assignee: Georgia Tech Research Corporation
- Current Assignee Address: US GA Atlanta
- Agency: Thomas, Kayden, Horstemeyer & Risley, LLP
- Main IPC: H05H3/02
- IPC: H05H3/02
Abstract:
Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
Public/Granted literature
- US20080265157A1 Scanning Ion Probe Systems and Methods of Use Thereof Public/Granted day:2008-10-30
Information query
IPC分类:
