Invention Grant
- Patent Title: System and method for predictive failure detection
- Patent Title (中): 用于预测性故障检测的系统和方法
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Application No.: US11759088Application Date: 2007-06-06
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Publication No.: US07702971B2Publication Date: 2010-04-20
- Inventor: Tuyet-Huong T. Nguyen , Mukund Khatri
- Applicant: Tuyet-Huong T. Nguyen , Mukund Khatri
- Applicant Address: US TX Round Rock
- Assignee: Dell Products L.P.
- Current Assignee: Dell Products L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Baker Botts L.L.P.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; H03M13/00 ; G11B5/09

Abstract:
A method of predicting failure of an information handling device, such as a server, by monitoring an error rate, i.e., n errors per error period. Errors are reported only if the error rate is exceeded. An error count is kept, and errors are leaked from the count if the time difference between errors is more than the error period.
Public/Granted literature
- US20080307273A1 System And Method For Predictive Failure Detection Public/Granted day:2008-12-11
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