A dynamic random access memory circuit is provided, having at least one write bit line, at least one read bit line, a capacitive storage device, a write access device operatively coupled to the capacitive storage device and the at least one write bit line, a sense amplifier operatively coupled to the at least one read bit line and configured to generate an output signal, a refresh bypass device operatively associated with the sense amplifier and the at least one write bit line so as to selectively pass the output signal to the at least one write bit line, and a write-read bypass device operatively coupled to the at least one write bit line and the at least one read bit line and configured to selectively pass a write signal from a write bit line signal point along the at least one write bit line to a read bit line signal point along the at least one read bit line for output to a data output. the output signal is selectively passed to the at least one write bit line. The write signal is selectively passed from the write bit line signal point along the at least one write bit line to the read bit line signal point along the at least one read bit line for output to the data output.