Invention Grant
US07676714B2 Extender strip and test assembly for testing memory card operation
有权
扩展板和测试组件用于测试存储卡操作
- Patent Title: Extender strip and test assembly for testing memory card operation
- Patent Title (中): 扩展板和测试组件用于测试存储卡操作
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Application No.: US11693648Application Date: 2007-03-29
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Publication No.: US07676714B2Publication Date: 2010-03-09
- Inventor: Alan Chiou , Bahman Qawami , Farshid Sabet-sharghi
- Applicant: Alan Chiou , Bahman Qawami , Farshid Sabet-sharghi
- Applicant Address: US CA Milpitas
- Assignee: SanDisk Corporation
- Current Assignee: SanDisk Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Vierra Magen Marcus & DeNiro LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/00
Abstract:
A system and method are disclosed for testing operation of a memory card within an electronic host device. The system includes a flat flexible cable, or strip, for electrically coupling between the memory card slot in a host device and a test assembly. The test assembly may have a card slot for accepting an external memory card, and a debug header for receiving a cable connected to a debug apparatus such as a logic analyzer and/or an oscilloscope.
Public/Granted literature
- US20080244140A1 EXTENDER STRIP AND TEST ASSEMBLY FOR TESTING MEMORY CARD OPERATION Public/Granted day:2008-10-02
Information query
