Invention Grant
US07676713B2 Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses 失效
使用交织在一起的刺激生成和响应验证规范进行自动化设备测试,用于管理产生无序响应的DUT

  • Patent Title: Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses
  • Patent Title (中): 使用交织在一起的刺激生成和响应验证规范进行自动化设备测试,用于管理产生无序响应的DUT
  • Application No.: US11261256
    Application Date: 2005-10-28
  • Publication No.: US07676713B2
    Publication Date: 2010-03-09
  • Inventor: Ryan Holmqvist
  • Applicant: Ryan Holmqvist
  • Applicant Address: US CA San Jose
  • Assignee: Integrated Device Technology, Inc.
  • Current Assignee: Integrated Device Technology, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Tracy Parris
  • Main IPC: G01R31/28
  • IPC: G01R31/28 G06F11/00
Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses
Abstract:
An intertwined test specification (ITTS) is used for controlling Automated Test Equipment (ATE) to apply a sequence of stimulus signals to a device under test (DUT) during a stimulus run and to validate returned response signals during a validation run. The ITTS has response validation scripts intertwined with stimulus invoking scripts where the response validation scripts are conditionally executed during the validation run but not during the stimulus invoking run. Response signals are logically associated with unique stimulus identification codes so that appropriate response signals can be matched with corresponding validation scripts even if the response signals are returned out-of-order to the ATE or to a response logging unit interposed between the ATE and the DUT.
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