Invention Grant
- Patent Title: Memory devices having reduced word line current and method of operating and manufacturing the same
- Patent Title (中): 具有减少字线电流的存储器件及其操作和制造方法
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Application No.: US11951166Application Date: 2007-12-05
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Publication No.: US07675778B2Publication Date: 2010-03-09
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
There is provided a memory array and methods for manufacturing the same. In one embodiment, there is provided a string comprising a plurality of transistors. Each of the plurality of transistors includes: a charge storage node, a control gate, and at least one resistive element coupled to the string. The control gate of at least one of the plurality of transistors can be selectively coupled to a reference potential via a corresponding one of the at least one resistive element.
Public/Granted literature
- US20090147588A1 MEMORY DEVICES HAVING REDUCED WORD LINE CURRENT AND METHOD OF OPERATING AND MANUFACTURING THE SAME Public/Granted day:2009-06-11
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