Invention Grant
- Patent Title: Duty cycle correcting circuit and duty cycle correcting method
- Patent Title (中): 占空比校正电路和占空比校正方法
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Application No.: US11878570Application Date: 2007-07-25
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Publication No.: US07675337B2Publication Date: 2010-03-09
- Inventor: Cheul-Hee Koo
- Applicant: Cheul-Hee Koo
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Venable LLP
- Agent Jeffri A. Kaminski
- Priority: KR10-2007-0014241 20070212
- Main IPC: H03K3/017
- IPC: H03K3/017 ; H03K5/04 ; H03K7/08

Abstract:
A duty cycle correcting circuit includes a first duty ratio correcting unit that widens a high-level period of an input clock in response to a detection signal, thereby correcting a duty ratio of the input clock to output a first corrected clock. A second duty ratio correcting unit narrows the high-level period of the input clock in response to the detection signal, thereby correcting the duty ratio of the input clock to output a second corrected clock. A clock selecting unit selectively outputs the first corrected clock or the second corrected clock as an output clock in response to the detection signal. A duty ratio detecting unit detects a duty ratio of the output clock, thereby generating the detection signal.
Public/Granted literature
- US20080191767A1 Duty cycle correcting circuit and duty cycle correcting method Public/Granted day:2008-08-14
Information query
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