Invention Grant
- Patent Title: Atmospheric pressure chemical vapor deposition
- Patent Title (中): 大气压化学气相沉积
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Application No.: US11573767Application Date: 2005-08-02
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Publication No.: US07674713B2Publication Date: 2010-03-09
- Inventor: Norman W. Johnston , Kenneth R. Kormanyos , Nicholas A. Reiter
- Applicant: Norman W. Johnston , Kenneth R. Kormanyos , Nicholas A. Reiter
- Applicant Address: DE Bitterfeld-Wolfen
- Assignee: Calyxo GmbH
- Current Assignee: Calyxo GmbH
- Current Assignee Address: DE Bitterfeld-Wolfen
- Agency: Fraser Clemens Martin & Miller LLC
- Agent Donald R. Fraser
- International Application: PCT/US2005/027371 WO 20050802
- International Announcement: WO2006/023263 WO 20060302
- Main IPC: H01L21/44
- IPC: H01L21/44 ; B05D5/12

Abstract:
A process for coating a substrate at atmospheric pressure comprises the steps of vaporizing a controlled mass of semiconductor material at substantially atmospheric pressure within a heated inert gas stream, to create a fluid mixture having a temperature above the condensation temperature of the semiconductor material, directing the fluid mixture at substantially atmospheric pressure onto the substrate having a temperature below the condensation temperature of the semiconductor material, and depositing a layer of the semiconductor material onto a surface of the substrate.
Public/Granted literature
- US20080153268A1 Atmosheric Pressure Chemical Vapor Deposition Public/Granted day:2008-06-26
Information query
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