Invention Grant
- Patent Title: Method and device for measuring at least a geometric quantity of an optically reflecting surface
- Patent Title (中): 用于测量至少几何量的光学反射表面的方法和装置
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Application No.: US10490469Application Date: 2002-09-26
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Publication No.: US07672485B2Publication Date: 2010-03-02
- Inventor: Jean-Pierre Chambard , Vincent Chalvidan
- Applicant: Jean-Pierre Chambard , Vincent Chalvidan
- Applicant Address: FR Saint-Louis
- Assignee: HOLO 3
- Current Assignee: HOLO 3
- Current Assignee Address: FR Saint-Louis
- Agency: Davis & Bujold, P.L.L.C.
- Priority: FR0112618 20010926
- International Application: PCT/FR02/03297 WO 20020926
- International Announcement: WO03/036230 WO 20030501
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N7/18 ; G01N21/00 ; G01B11/24

Abstract:
A quick, reliable and accurate method and device for measuring an optically reflecting surface, enabling quantifying of the curvatures and/or slopes and raised parts of the optically reflecting surface without risk of deteriorating the measured surface and adapted to measurement of large-dimension surfaces. The system and method for measuring the geometry of an optically reflecting surface to be measured S includes observing with a camera (2) the image of the surface to be measured S set in a measuring space (1), then interpreting the image in quantitative values characterizing at least one geometric quantity of the optically reflecting surface to be measured S.
Public/Granted literature
- US20040246497A1 Method and device for measuring at least a geometric quantity of an optically reflecting surface Public/Granted day:2004-12-09
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