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US07672485B2 Method and device for measuring at least a geometric quantity of an optically reflecting surface 有权
用于测量至少几何量的光学反射表面的方法和装置

Method and device for measuring at least a geometric quantity of an optically reflecting surface
Abstract:
A quick, reliable and accurate method and device for measuring an optically reflecting surface, enabling quantifying of the curvatures and/or slopes and raised parts of the optically reflecting surface without risk of deteriorating the measured surface and adapted to measurement of large-dimension surfaces. The system and method for measuring the geometry of an optically reflecting surface to be measured S includes observing with a camera (2) the image of the surface to be measured S set in a measuring space (1), then interpreting the image in quantitative values characterizing at least one geometric quantity of the optically reflecting surface to be measured S.
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