Invention Grant
US07672102B2 Electrical overstress protection 有权
电气过载保护

Electrical overstress protection
Abstract:
In one aspect, a method for protection of an integrated circuit device includes but is not limited to detecting a first current in the integrated circuit device, wherein the first current is caused by a second current; and shunting the second current away from the integrated circuit device in response to detecting the first current. Such detecting may include but not be limited to detecting the first current by detecting a voltage drop across a sensing resistor, which may include but not be limited to using at least two sensing transistors. Such shunting may include but not be limited to using at least one shunting transistor.
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