Invention Grant
- Patent Title: Lateral field-effect transistor having an insulated trench gate electrode
- Patent Title (中): 具有绝缘沟槽栅极的横向场效应晶体管
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Application No.: US10561732Application Date: 2004-06-10
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Publication No.: US07671440B2Publication Date: 2010-03-02
- Inventor: Raymond J. E. Hueting , Erwin A. Hijzen
- Applicant: Raymond J. E. Hueting , Erwin A. Hijzen
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: GB0314390.6 20030620
- International Application: PCT/IB2004/001992 WO 20040610
- International Announcement: WO2004/114411 WO 20041229
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
A field-effect transistor having cells (18) each having a source region (22), source body region (26), drift region (20), drain body region (28) and drain region (24) arranged longitudinally, laterally alternating with structures to achieve a reduced surface field. In embodiments, the structures can include longitudinally spaced insulated gate trenches (35) defining a gate region (31) adjacent the source or drain region (22, 24) and a longitudinally extending potential plate region (33) adjacent the drift region (20). Alternatively, a separate potential plate region (33) or a longitudinally extending semi-insulating field plate (50) may be provided adjacent the drift region (20). The transistor is suitable for bi-directional switching.
Public/Granted literature
- US20080203473A1 Lateral Field-Effect Transistor Having an Insulated Trench Gate Electrode Public/Granted day:2008-08-28
Information query
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