Invention Grant
- Patent Title: Method of aligning probe for eddy current inspection
- Patent Title (中): 用于涡流检测的探头对准方法
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Application No.: US11466503Application Date: 2006-08-23
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Publication No.: US07657389B2Publication Date: 2010-02-02
- Inventor: Ui W. Suh , Richard C. Knepfle
- Applicant: Ui W. Suh , Richard C. Knepfle
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: McNees Wallace & Nurick, LLC
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G06F19/00 ; G06F17/40

Abstract:
A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
Public/Granted literature
- US20070244659A1 METHOD OF ALIGNING PROBE FOR EDDY CURRENT INSPECTION Public/Granted day:2007-10-18
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