Invention Grant
US07657360B2 Frequency analysis system and method for detecting improper actuation system performance and element operation 有权
用于检测不正确的致动系统性能和元件操作的频率分析系统和方法

  • Patent Title: Frequency analysis system and method for detecting improper actuation system performance and element operation
  • Patent Title (中): 用于检测不正确的致动系统性能和元件操作的频率分析系统和方法
  • Application No.: US11549197
    Application Date: 2006-10-13
  • Publication No.: US07657360B2
    Publication Date: 2010-02-02
  • Inventor: John Skowron
  • Applicant: John Skowron
  • Applicant Address: US NJ Morristown
  • Assignee: Honeywell International, Inc.
  • Current Assignee: Honeywell International, Inc.
  • Current Assignee Address: US NJ Morristown
  • Main IPC: F02D41/30
  • IPC: F02D41/30
Frequency analysis system and method for detecting improper actuation system performance and element operation
Abstract:
Dither frequency analysis systems include a controller for directing a control signal and a dither frequency to an actuation driver. One or more sensors are used for receiving and relaying a signal downstream from an actuation element, which downstream signal includes the dither frequency. A frequency analysis device receives and analyzes the downstream dither frequency and directs the same to a controller that is configured to evaluate the analyzed downstream dither frequency, and evaluate whether the same indicates proper or improper actuation system operation. The downstream dither frequency is analyzed and evaluated at a frequency of less than about one second, and the frequency analysis device analyzes downstream dither frequencies in the range of from about 50 to 500 hertz. The system can include algorithms and test sequences to address and/or further evaluate improper actuation system operation.
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