Invention Grant
- Patent Title: Calibrating a defect scan parameter for a disk drive
- Patent Title (中): 校准磁盘驱动器的缺陷扫描参数
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Application No.: US11757824Application Date: 2007-06-04
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Publication No.: US07656763B1Publication Date: 2010-02-02
- Inventor: Ming Jin , Teik Ee Yeo
- Applicant: Ming Jin , Teik Ee Yeo
- Applicant Address: US CA Lake Forest
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Lake Forest
- Agent Howard H. Sheerin, Esq.
- Main IPC: G11B5/09
- IPC: G11B5/09

Abstract:
A method is disclosed for performing a defect scan for a disk drive. Data is recorded on a first data area of a disk substantially free from defects and on a second data area of the disk substantially affected by at least one defect. A defect scan parameter is initialized with an initial setting. The first data area is read to determine a first defect threshold, and the second data area is read to determine a second defect threshold. A margin is saved representing a difference between the first and second defect thresholds. The setting for the defect scan parameter is adjusted, and the elements of reading the first and second data areas and saving a corresponding margin are repeated at least once. A setting is then selected for the defect scan parameter in response to the saved margins.
Information query
IPC分类: