Invention Grant
US07656185B2 Semiconductor integrated circuit device with a fail-safe IO circuit and electronic device including the same
有权
具有故障保护IO电路的半导体集成电路装置和包括其的电子装置
- Patent Title: Semiconductor integrated circuit device with a fail-safe IO circuit and electronic device including the same
- Patent Title (中): 具有故障保护IO电路的半导体集成电路装置和包括其的电子装置
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Application No.: US11826312Application Date: 2007-07-13
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Publication No.: US07656185B2Publication Date: 2010-02-02
- Inventor: Dae Gyu Kim , Eon Guk Kim , Ju Young Kim
- Applicant: Dae Gyu Kim , Eon Guk Kim , Ju Young Kim
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2006-0075920 20060811
- Main IPC: H03K19/007
- IPC: H03K19/007
Abstract:
A semiconductor IC device includes at least one IO port, a core logic, and at least one fail-safe IO circuit, the fail-safe IO circuit being coupled between the core logic and the IO port, wherein the fail-safe IO circuit is configured to receive a predetermined control signal and to maintain the IO port at a predetermined impedance with respect to the predetermined control signal.
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