Invention Grant
US07655886B2 Method of measuring a heating plate temperature, substrate processing device and computer-readable recording medium with computer program recorded thereon for measuring the heating plate temperature
有权
用于测量加热板温度的方法,基板处理装置和其上记录有用于测量加热板温度的计算机程序的计算机可读记录介质
- Patent Title: Method of measuring a heating plate temperature, substrate processing device and computer-readable recording medium with computer program recorded thereon for measuring the heating plate temperature
- Patent Title (中): 用于测量加热板温度的方法,基板处理装置和其上记录有用于测量加热板温度的计算机程序的计算机可读记录介质
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Application No.: US11632965Application Date: 2005-08-08
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Publication No.: US07655886B2Publication Date: 2010-02-02
- Inventor: Hiroshi Tomita , Ryuji Asai
- Applicant: Hiroshi Tomita , Ryuji Asai
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2004-234765 20040811; JP2005-199673 20050708
- International Application: PCT/JP2005/014510 WO 20050808
- International Announcement: WO2006/016550 WO 20060216
- Main IPC: H05B1/02
- IPC: H05B1/02 ; H05B3/68

Abstract:
When a heating plate performs heat treatment on a substrate by a wireless wafer provided with a temperature detecting portion, a storing portion and a controller, the temperature of the heating plate is measured readily and accurately while suppressing lowering of a heating operation efficiency due to a measuring operation. A temperature measurement start instruction is provided to the controller of the wireless wafer at a position in a wireless wafer carrier, and thereby the wireless wafer starts temperature detection to store time-series data of the detected temperature value in the storing portion. The wireless wafer is transferred to a heating unit through a predetermined transfer path. Based on a transportation time required for placing the wireless wafer on the heating plate and the time-series data of the detected temperature value in the storing portion, the time-series data of the detected temperature value obtained after the wireless wafer is placed on the heating plate is fetched.
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