Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US12153313Application Date: 2008-05-16
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Publication No.: US07655504B2Publication Date: 2010-02-02
- Inventor: Naohiro Mashino
- Applicant: Naohiro Mashino
- Applicant Address: JP Nagano-shi
- Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee Address: JP Nagano-shi
- Agency: Krantz, Quintos & Hanson, LLP
- Priority: JP2002-174285 20020614
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
Two semiconductor substrates are first bonded together by means of a metal bump, while respective one-side surfaces on which device patterns are formed are faced each other, and a resin is then filled into a gap between the respective one-side surfaces and thereafter each of the semiconductor substrates is polished and thinned to a prescribed thickness. Furthermore, a via hole and an insulating film are formed; part of a portion in contact with the metal bump, of the insulating film, is opened; the inside of the via hole is filled with a conductor; and an electrode pad is formed on the conductor, to thereby form structures. Finally, a required number of structures are electrically connected with each other through the electrode pad and stacked to thereby obtain a semiconductor device.
Public/Granted literature
- US20080233677A1 Semiconductor device and method of manufacturing the same Public/Granted day:2008-09-25
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