Invention Grant
- Patent Title: X-ray tube and method for determination of focal spot properties
- Patent Title (中): X射线管和焦斑特性测定方法
-
Application No.: US12095352Application Date: 2006-11-27
-
Publication No.: US07654740B2Publication Date: 2010-02-02
- Inventor: Rolf Karl Otto Behling , Wolfgang Chrost , Michael Lübcke
- Applicant: Rolf Karl Otto Behling , Wolfgang Chrost , Michael Lübcke
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP05111585 20051201
- International Application: PCT/IB2006/054459 WO 20061127
- International Announcement: WO2007/063479 WO 20070607
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
X-ray tube and method for determination of focal spot properties The invention relates to an x-ray tube (1) comprising at least one cathode (3) which emits electrons accelerated towards a rotating anode (5) such that the focal spot (27) is formed on a surface (9) of the anode (5). A structure (15), in particular slits or pits (13), is disposed on the surface (9) of the anode (5). The x-ray tube (1) comprises a detector (7) for detecting a detection signal which changes, if the structure (15) on the rotating anode (5) passes the focal spot. The x-ray tube (1) further comprises determination means (6) for determining properties of the focal spot from changes of the detection signal. Thus, properties of the focal spot can be determined from changes of the detection signal during operation of the x-ray tube (1).
Public/Granted literature
- US20090067578A1 X-RAY TUBE AND METHOD FOR DETERMINATION OF FOCAL SPOT PROPERTIES Public/Granted day:2009-03-12
Information query