Invention Grant
- Patent Title: Memory cell bit valve loss detection and restoration
- Patent Title (中): 存储单元位阀失效检测和恢复
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Application No.: US11648490Application Date: 2006-12-28
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Publication No.: US07653846B2Publication Date: 2010-01-26
- Inventor: Nam Sung Kim , Muhammad Kheliah , Yibin Ye , Dinesh Somasekhar , Vivek De
- Applicant: Nam Sung Kim , Muhammad Kheliah , Yibin Ye , Dinesh Somasekhar , Vivek De
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agent Matthew C. Fagan
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
For one embodiment, an apparatus may include a memory cell to store a bit value, wherein the memory cell may lose the bit value in response to a memory access operation. The apparatus may also include first circuitry to detect whether the memory cell loses the bit value in response to the memory access operation and second circuitry to restore the bit value in the memory cell in response to detection that the memory cell loses the bit value. Other embodiments include other apparatuses, methods, and systems.
Public/Granted literature
- US20080162986A1 Memory cell bit valve loss detection and restoration Public/Granted day:2008-07-03
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