Invention Grant
- Patent Title: Methods and apparatus to detect patterns in programs
- Patent Title (中): 检测程序中的模式的方法和装置
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Application No.: US10424356Application Date: 2003-04-28
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Publication No.: US07647585B2Publication Date: 2010-01-12
- Inventor: Mingqiu Sun
- Applicant: Mingqiu Sun
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Hanley, Flight & Zimmerman, LLC
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
Methods and apparatus are disclosed to detect patterns in an executing program. An example method disclosed herein develops a trace of a program; identifies a sequence of program states from the trace by comparing intersecting sets of data at least partially indicative of addresses associated with the trace; develops a set of probabilities of transitioning between pairs of program states in the series of program states; identifies a current program state of the program; and predicts a next program state of the program based on the current program state and at least one of the probabilities.
Public/Granted literature
- US20040216013A1 Methods and apparatus to detect patterns in programs Public/Granted day:2004-10-28
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