Invention Grant
- Patent Title: Test carriers for storage devices
- Patent Title (中): 用于存储设备的测试载体
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Application No.: US10597074Application Date: 2005-04-26
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Publication No.: US07646596B2Publication Date: 2010-01-12
- Inventor: Bee Keong Ng
- Applicant: Bee Keong Ng
- Applicant Address: SG Singapore
- Assignee: Innovative Polymers Pte. Ltd.
- Current Assignee: Innovative Polymers Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Intellectual Property Law Group LLP
- Agent Juneko Jackson; Otto O. Lee
- International Application: PCT/SG2005/000132 WO 20050426
- International Announcement: WO2006/115465 WO 20061102
- Main IPC: H05K7/20
- IPC: H05K7/20

Abstract:
A test carrier 10 for storage devices 38 comprising a carrier base 12; a slider tray 16 slidably mounted to the carrier base 12, the slider tray 16 having at least one aperture for receiving a storage device 38 therein; at least one storage device connector 20 connected to the carrier base 12; and a tester interface 22, where, when the slider tray 16 is in a first position, the storage device 38 can be received within the at least one aperture of the slider tray 16 and, when the slider tray 16 is in a second position, an interface of the storage device 38 mates with the storage device connector 20; appropriate circuitry contained in the carrier base 12 connecting the tester interface 22 and the storage device connector 20 thereafter allowing the storage device 38 to be tested via the tester interface 22.
Public/Granted literature
- US20090190299A1 "Test Carriers for Storage Devices" Public/Granted day:2009-07-30
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