Invention Grant
- Patent Title: Optical measuring machine
- Patent Title (中): 光学测量机
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Application No.: US11878543Application Date: 2007-07-25
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Publication No.: US07646492B2Publication Date: 2010-01-12
- Inventor: Kenji Ochi , Naoya Kikuchi , Shinji Takahashi
- Applicant: Kenji Ochi , Naoya Kikuchi , Shinji Takahashi
- Applicant Address: JP Kawasaki
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-205243 20060727
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/14

Abstract:
An optical measuring device includes: a screen having a reference line; a movable stage; an optical system for forming on the screen an optical image of a to-be-measured object placed on the stage; and an edge detecting sensor (112) for detecting a passage of a measurement edge of the optical image at an arbitrary position on the screen. The optical measuring device further includes: an offset value storage (143) storing a distance between the reference line and the edge detecting sensor (112) as an offset value; and a correction data calculator (144) for correcting measurement data measured with the reference line and the edge detecting sensor (112) by use of the offset value.
Public/Granted literature
- US20080024791A1 Optical measuring machine Public/Granted day:2008-01-31
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