Invention Grant
- Patent Title: On-chip detection of power supply vulnerabilities
- Patent Title (中): 片上检测电源漏洞
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Application No.: US12013833Application Date: 2008-01-14
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Publication No.: US07646208B2Publication Date: 2010-01-12
- Inventor: Frank D. Ferraiolo , Anuja Sehgal , Peilin Song , Michael A. Sperling
- Applicant: Frank D. Ferraiolo , Anuja Sehgal , Peilin Song , Michael A. Sperling
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent William A. Kinnaman, Jr., Esq.; Blanche E. Schiller, Esq.
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01R31/28 ; H01L23/58

Abstract:
On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.
Public/Granted literature
- US20080129325A1 ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES Public/Granted day:2008-06-05
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