Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
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Application No.: US12320280Application Date: 2009-01-22
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Publication No.: US07646072B2Publication Date: 2010-01-12
- Inventor: Yuuichi Kamimuta , Akira Nishiyama , Yasushi Nakasaki , Tsunehiro Ino , Masato Koyama
- Applicant: Yuuichi Kamimuta , Akira Nishiyama , Yasushi Nakasaki , Tsunehiro Ino , Masato Koyama
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2005-232979 20050811
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
It is possible to prevent the deterioration of device characteristic as much as possible. A semiconductor device includes: a semiconductor substrate; a gate insulating film provided above the semiconductor substrate and containing a metal, oxygen and an additive element; a gate electrode provided above the gate insulating film; and source/drain regions provided in the semiconductor substrate on both sides of the gate electrode. The additive element is at least one element selected from elements of Group 5, 6, 15, and 16 at a concentration of 0.003 atomic % or more but 3 atomic % or less.
Public/Granted literature
- US20090134479A1 Semiconductor device and method for manufacturing the same Public/Granted day:2009-05-28
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