Invention Grant
- Patent Title: Method for automated testing of the modulation transfer function in image sensors
- Patent Title (中): 图像传感器中调制传递函数的自动测试方法
-
Application No.: US11472435Application Date: 2006-06-22
-
Publication No.: US07646016B2Publication Date: 2010-01-12
- Inventor: Kevin Duesman , Jeffrey Bruce , Peter P. Altice, Jr. , Moshe Reuven , Donald E. Robinson , Ed Jenkins , Joey Shah
- Applicant: Kevin Duesman , Jeffrey Bruce , Peter P. Altice, Jr. , Moshe Reuven , Donald E. Robinson , Ed Jenkins , Joey Shah
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: H01L23/58
- IPC: H01L23/58
Abstract:
A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
Public/Granted literature
- US20060237755A1 Method for automated testing of the modulation transfer function in image sensors Public/Granted day:2006-10-26
Information query
IPC分类:
