Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US12149053Application Date: 2008-04-25
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Publication No.: US07645986B2Publication Date: 2010-01-12
- Inventor: Hiromichi Kikuma , Hidenori Nanba , Akimasa Osaka
- Applicant: Hiromichi Kikuma , Hidenori Nanba , Akimasa Osaka
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2006-063480 20060309
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/42 ; B01D59/44

Abstract:
An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.
Public/Granted literature
- US20080203292A1 Mass spectrometer Public/Granted day:2008-08-28
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