Invention Grant
- Patent Title: Ion source and mass spectrometer instrument using the same
- Patent Title (中): 离子源和质谱仪使用相同
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Application No.: US10139241Application Date: 2002-05-07
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Publication No.: US07645983B2Publication Date: 2010-01-12
- Inventor: Atsumu Hirabayashi , Minoru Sakairi , Yasuaki Takada , Hideaki Koizumi , Kaoru Umemura
- Applicant: Atsumu Hirabayashi , Minoru Sakairi , Yasuaki Takada , Hideaki Koizumi , Kaoru Umemura
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
An ion source includes a body having a gas passage and an orifice. A capillary is inserted into the gas passage so that a tip portion of the capillary extends into the orifice. A gas supplier supplies a gas into the gas passage to form a gas flow through the gas passage along the capillary and through the orifice past a tip of the capillary so that the gas flow sprays a sample solution flowing through the capillary from the tip of the capillary. A flow controller regulates a pressure of the gas in the gas passage to adjust a characteristic value F/S to a predetermined value, where F is a flow rate of the gas flow at standard conditions (20° C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of the tip portion of the capillary in the orifice.
Public/Granted literature
- US20020125426A1 Ion source and mass spectrometer instrument using the same Public/Granted day:2002-09-12
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