Invention Grant
- Patent Title: Method and apparatus for error detection and correction
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Application No.: US11518824Application Date: 2006-09-11
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Publication No.: US07644348B2Publication Date: 2010-01-05
- Inventor: Michael L. Longwell , William Daune Atwell , Jeffrey Van Myers
- Applicant: Michael L. Longwell , William Daune Atwell , Jeffrey Van Myers
- Applicant Address: US TX Spicewood
- Assignee: Madrone Solutions, Inc.
- Current Assignee: Madrone Solutions, Inc.
- Current Assignee Address: US TX Spicewood
- Agent Jeffrey Van Myers; Joseph Pumo; Artie A. Pennington
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00

Abstract:
A Random Access Error Detection and Correction unit (RAEDAC) that incorporates a bit-wise error detection and correction unit (BEDAC) in a memory system. In one embodiment, a word-wise error detection and correction unit (WEDAC) operates in coordination with a BEDAC that performs a bit-wise parity calculation. In another embodiment, a WEDAC operates in coordination with a full bit-wise BEDAC that calculates bit-wise check bits. The RAEDAC may be applied to create a multi-dimensional EDAC where, for example, the memory is partitioned into a stack of planes, and a stack-wise error detection and correction unit (SEDAC) is implemented.
Public/Granted literature
- US20070214403A1 Method and apparatus for error detection and correction Public/Granted day:2007-09-13
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