Invention Grant
- Patent Title: Format detection
- Patent Title (中): 格式检测
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Application No.: US10534359Application Date: 2003-11-07
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Publication No.: US07644346B2Publication Date: 2010-01-05
- Inventor: Cyril Valadon
- Applicant: Cyril Valadon
- Applicant Address: KY Cayman Islands CN Shenzhen FR Issy les Moulineaux TW
- Assignee: MStar Semiconductor, Inc.,MStar Software R&D, Ltd.,Mstar France SAS,MStar Semiconductor, Inc.
- Current Assignee: MStar Semiconductor, Inc.,MStar Software R&D, Ltd.,Mstar France SAS,MStar Semiconductor, Inc.
- Current Assignee Address: KY Cayman Islands CN Shenzhen FR Issy les Moulineaux TW
- Agency: Edell, Shapiro & Finnan, LLC
- Priority: GB0226004.0 20021107
- International Application: PCT/GB03/04819 WO 20031107
- International Announcement: WO2004/042990 WO 20040521
- Main IPC: H03M13/03
- IPC: H03M13/03

Abstract:
A method of assessing an encoded signal to determine whether a candidate format was used to arrange the signal into blocks before the encoding was done, the method comprising: using the Viterbi algorithm to determine trellis metrics for a point in said signal that would be an end point of a candidate block according to the candidate format; determining from said metrics the likelihood of occupation at said point of an end state of an encoding scheme used to create the encoded signal; decoding a part of said signal ending at said point; and performing a check using said decoded part to determine whether the candidate block satisfies an error protection scheme of the candidate format.
Public/Granted literature
- US20060146963A1 Format detection Public/Granted day:2006-07-06
Information query
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