Invention Grant
- Patent Title: Integrated circuit and method for identifying propagation time errors in integrated circuits
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Application No.: US11752785Application Date: 2007-05-23
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Publication No.: US07644332B2Publication Date: 2010-01-05
- Inventor: Martin Kaibel , Olivier Barondeau
- Applicant: Martin Kaibel , Olivier Barondeau
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Dicke, Billig & Czaja PLLC
- Priority: DE102006024507 20060523
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An integrated circuit is disclosed. In one embodiment, for each clock domain there is at least one clock driver which is situated in the integrated circuit and which drives circuits situated in the clock domain. Each clock driver in the clock domain contains a clock input and an enable input, and its output outputs the clock received at the clock input if an enable signal is applied to the enable input. The clock driver receives a clock derived from the signal at the functional clock input, and the enable signal is connected in line with the values stored in the signal sequence registers if there is a signal change at the scan clock input when the scan chain shift mode has been switched off.
Public/Granted literature
- US07689885B2 Integrated circuit and method for identifying propagation time errors in integrated circuits Public/Granted day:2010-03-30
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