Invention Grant
- Patent Title: Testing system and testing system control method
- Patent Title (中): 测试系统和测试系统控制方法
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Application No.: US11730259Application Date: 2007-03-30
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Publication No.: US07644326B2Publication Date: 2010-01-05
- Inventor: Haruyoshi Ono
- Applicant: Haruyoshi Ono
- Applicant Address: JP Yamanashi
- Assignee: Eudyna Devices Inc.
- Current Assignee: Eudyna Devices Inc.
- Current Assignee Address: JP Yamanashi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2006-101122 20060331
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A testing system includes a plurality of test applying portions and a plurality of testing portions, each test applying portion having a test device that generates an output signal and each testing portion tests the output signal of the test device, in response to the test applying portion. The testing system further includes a switch portion that switches the output signal of the test device between the test applying portions and the testing portions. The switch portion includes, a first switch having an input port and a plurality of output ports, which selects the output port for connecting the input port, a second switch having a plurality of input ports and an output port, which selects the input port for connecting the output port, and a connecting portion that has a plurality of transmission parts that connect the output ports of the first switch and the input ports of the second switch.
Public/Granted literature
- US20070245189A1 Testing system and testing system control method Public/Granted day:2007-10-18
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