Invention Grant
- Patent Title: Abbreviated index
- Patent Title (中): 缩写索引
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Application No.: US11681673Application Date: 2007-03-02
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Publication No.: US07644082B2Publication Date: 2010-01-05
- Inventor: Ronald P. Millett , Dillon K. Inouye
- Applicant: Ronald P. Millett , Dillon K. Inouye
- Applicant Address: US UT Provo
- Assignee: Perfect Search Corporation
- Current Assignee: Perfect Search Corporation
- Current Assignee Address: US UT Provo
- Agency: Workman Nydegger
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
Abbreviated index of parameter patterns. An abbreviated index includes indicators that a parameter pattern may be in a set of parameter patterns. To create the abbreviated index, indicators for overlapping parameter patterns of a given parameter pattern are placed in the index. Different patterns may have the same indicator, so the abbreviated index does not necessarily give an absolute indication of the presence of a parameter pattern in the set of parameter patterns, but rather may give an indication of the possible inclusion of a parameter pattern. The use of indicators for overlapping patterns can be used to increase confidence as to the existence of a given parameter pattern in the set of parameter patterns. The absence of an indicator for a parameter pattern or an overlapping parameter pattern will indicate with certainty that the parameter pattern is not present in the set of parameter patterns.
Public/Granted literature
- US20080059462A1 ABBREVIATED INDEX Public/Granted day:2008-03-06
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