Invention Grant
- Patent Title: Calibrating automatic test equipment to account for magnitude and phase offsets
- Patent Title (中): 校准自动测试设备以考虑幅度和相位偏移
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Application No.: US11094934Application Date: 2005-03-31
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Publication No.: US07643545B2Publication Date: 2010-01-05
- Inventor: Toshihide Kadota
- Applicant: Toshihide Kadota
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: H04B3/46
- IPC: H04B3/46
Abstract:
A method of calibrating automatic test equipment (ATE) having transmission paths that transport signals includes obtaining amplitude gains of the signals across the transmission paths, obtaining phase delays of the signals across the transmission paths, obtaining magnitude and phase offsets associated with the signals based on the amplitude gains and the phase delays, and calibrating the ATE using the magnitude and phase offsets.
Public/Granted literature
- US20060222062A1 Calibrating automatic test equipment to account for magnitude and phase offsets Public/Granted day:2006-10-05
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