Invention Grant
- Patent Title: Variable resistive memory
- Patent Title (中): 可变电阻存储器
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Application No.: US11750487Application Date: 2007-05-18
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Publication No.: US07643344B2Publication Date: 2010-01-05
- Inventor: Byung-Gil Choi
- Applicant: Byung-Gil Choi
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2006-0090507 20060919
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A variable resistive memory device includes memory sectors, memory cells in each of the memory sectors, sub-wordlines including a first in signal communication with at least a first pair of the memory cells in a first sector and a second in signal communication with at least a second pair of the memory cells in a second sector, local bitlines where each is in signal communication a memory cell, a local bitline selecting signal generator in signal communication with local bitline selecting signal paths, a first local bitline selecting signal path in signal communication with a first pair of the local bitlines, and a second local bitline selecting signal path in signal communication with a second pair of the plurality of local bitlines, where a first of the first pair of local bitlines is in signal communication with a first of the first pair of the memory cells in the first sector and a second of the first pair of local bitlines is in signal communication with a second of the second pair of the memory cells in the second sector, and a first of the second pair of local bitlines is in signal communication with a second of the first pair of the memory cells in the first sector and a second of the second pair of local bitlines is in signal communication with a first of the second pair of the memory cells in the second sector.
Public/Granted literature
- US20080068875A1 VARIABLE RESISTIVE MEMORY Public/Granted day:2008-03-20
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