Invention Grant
- Patent Title: Phase change memory device
- Patent Title (中): 相变存储器件
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Application No.: US11987758Application Date: 2007-12-04
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Publication No.: US07643336B2Publication Date: 2010-01-05
- Inventor: Hee Bok Kang , Jin Hong An , Suk Kyoung Hong
- Applicant: Hee Bok Kang , Jin Hong An , Suk Kyoung Hong
- Applicant Address: KR Kyoungki-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-do
- Agency: Ladas & Parry LLP
- Priority: KR10-2007-0080667 20070810
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A phase change memory device comprises a cell array unit including a phase change resistance cell disposed in a region where a word line and a bit line are crossed, a sense amplifier configured to sense and amplify data of the phase change resistance cell, a write driving unit configured to supply a write voltage corresponding to data to be written in the cell array unit in response to an enabling signal, and a write verifying control unit controlled by an activation control signal and configured to compare data read through the sense amplifier with the data to be written so as to output the enabling signal.
Public/Granted literature
- US20090043973A1 Phase change memory device Public/Granted day:2009-02-12
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