Invention Grant
- Patent Title: Three-dimensional shape measuring system, and three-dimensional shape measuring method
- Patent Title (中): 三维形状测量系统,三维形状测量方法
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Application No.: US11879686Application Date: 2007-07-18
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Publication No.: US07643159B2Publication Date: 2010-01-05
- Inventor: Shinji Yamamoto , Yoshihisa Abe
- Applicant: Shinji Yamamoto , Yoshihisa Abe
- Applicant Address: JP Sakai-shi
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Sakai-shi
- Agency: Sidley Austin LLP
- Priority: JP2006-201470 20060725
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A three-dimensional shape measuring system includes: a light projecting/receiving apparatus which causes a light receiver to receive light reflected on a surface of a measurement object onto a light receiving surface thereof at a predetermined cycle multiple times, while changing a projecting direction of the light; and a measuring apparatus for measuring a three-dimensional shape of the measurement object, utilizing light receiving data. The measuring apparatus includes: a light receiving time setter for setting a light receiving time in each cycle with respect to each of light receiving areas constituting the light receiving surface; a data converter for converting an output value representing the light receiving data obtained in each cycle into an output value standardized with respect to the light receiving time in each cycle, if the light receiving times are different in the cycles; a projection timing acquirer for acquiring a projection timing at which the light receiving amount of each light receiving area is maximum; and a position acquirer for acquiring a position of a measurement point on the surface of the measurement object corresponding to each light receiving area.
Public/Granted literature
- US20080024795A1 Three-dimensional shape measuring system, and three-dimensional shape measuring method Public/Granted day:2008-01-31
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