Invention Grant
- Patent Title: Large field of view projection optical system with aberration correctability
- Patent Title (中): 大视野投影光学系统具有像差校正能力
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Application No.: US11646609Application Date: 2006-12-28
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Publication No.: US07643128B2Publication Date: 2010-01-05
- Inventor: Robert D. Harned , Cheng-Qun Gui , Pieter Willem Herman De Jager
- Applicant: Robert D. Harned , Cheng-Qun Gui , Pieter Willem Herman De Jager
- Applicant Address: NL Veldhoven NL Veldhoven
- Assignee: ASML Holding N.V.,ASML Netherlands B.V.
- Current Assignee: ASML Holding N.V.,ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G03B27/00
- IPC: G03B27/00 ; G03B27/70

Abstract:
An exposure system for manufacturing flat panel displays (FPDs) includes a reticle stage adapted to support a reticle. A substrate stage is adapted to support a substrate. A reflective optical system is adapted to image the reticle onto the substrate. The reflective optical system includes a primary mirror including a first mirror and a second mirror, and a secondary mirror. The reflective optical system has sufficient degrees of freedom for both alignment and correction of third order aberrations when projecting an image of the reticle onto the substrate by reflections off the first mirror, the secondary mirror, and the second mirror.
Public/Granted literature
- US20070195304A1 Large field of view projection optical system with aberration correctability Public/Granted day:2007-08-23
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